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HRID 537661作成日:2026年10月27日

Tetraethoxysilane → Tmos gaps

https://huagongshe.com/reaction/537661

反応式

関与物質

役割名称HCID仕込み量
反応物TetraethoxysilaneHCID 6517—
反応物TetramethoxysilaneHCID 12682—
反応物(3-Aminopropyl)triethoxysilaneHCID 13521—
溶媒WaterHCID 962—
生成物Tmos gapsHCID 87361843—

反応手順

Substrate film casting procedure—HEC and TEOS and GAPS HEC (1.25 g) was completely dissolved in deionized water (250 mL) and stirred vigorously for about 16 hours to provide a 0.5 wt % solution. Then 0.875 mL tetramethylorthosilicate (TMOS) and 0.125 mL γ-aminopropyltriethoxysilane (GAPS) were added to the 50 g of the HEC solution with stirring to provide a 1:3.5:0.5 (w:v:v) HEC/TMOS/GAPS solution. After approximately 10 minutes, the combined HEC/silica solution was added to a well plate as above. The solution was allowed to evaporate at room temperature 16 hours with lid on, followed by 75° C. for 8 hours, until dry. The plates were sterilized by UV irradiation (1 hr @ 366 nm).

情報源と証拠

DOI10.6084/m9.figshare.5104873.v1
特許番号US08865465B2
出典データセットuspto-grants-2014_10
ORD IDord-206b58d8b030492aa0cd56c7f56830cb
出典メモuspto-grants-2014_10