化工社化工社 化学情報印刷レポート · 研究参考用
Tetraethoxysilane → Tmos gaps
関与物質
| 役割 | 名称 | HCID | 仕込み量 |
|---|---|---|---|
| 反応物 | Tetraethoxysilane | HCID 6517 | — |
| 反応物 | Tetramethoxysilane | HCID 12682 | — |
| 反応物 | (3-Aminopropyl)triethoxysilane | HCID 13521 | — |
| 溶媒 | Water | HCID 962 | — |
| 生成物 | Tmos gaps | HCID 87361843 | — |
反応手順
Substrate film casting procedure—HEC and TEOS and GAPS HEC (1.25 g) was completely dissolved in deionized water (250 mL) and stirred vigorously for about 16 hours to provide a 0.5 wt % solution. Then 0.875 mL tetramethylorthosilicate (TMOS) and 0.125 mL γ-aminopropyltriethoxysilane (GAPS) were added to the 50 g of the HEC solution with stirring to provide a 1:3.5:0.5 (w:v:v) HEC/TMOS/GAPS solution. After approximately 10 minutes, the combined HEC/silica solution was added to a well plate as above. The solution was allowed to evaporate at room temperature 16 hours with lid on, followed by 75° C. for 8 hours, until dry. The plates were sterilized by UV irradiation (1 hr @ 366 nm).
情報源と証拠
| DOI | 10.6084/m9.figshare.5104873.v1 |
|---|---|
| 特許番号 | US08865465B2 |
| 出典データセット | uspto-grants-2014_10 |
| ORD ID | ord-206b58d8b030492aa0cd56c7f56830cb |
| 出典メモ | uspto-grants-2014_10 |