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Huagongshe화공사 화학 정보 인쇄 보고서 · 연구 참고용
HRID 1955569생성일: 2026년 10월 26일

Hydrogen Peroxide → Hydrogen Peroxide

https://huagongshe.com/reaction/1955569

반응식

참여 물질

역할이름HCID투입량
반응물Hydrogen PeroxideHCID 784—
반응물Sulfuric AcidHCID 1118—
반응물Titanium silicide (TiSi2)HCID 6336889—
반응물Azane;hydrateHCID 12896473—
생성물Hydrogen PeroxideHCID 784—
생성물Sulfuric AcidHCID 1118—
생성물Titanium mononitrideHCID 93091—

반응 단계

In this embodiment, the first wet etching is performed using a mixed solution of the composition of H2SO4 :H2O2 =5:1 at an etchant temperature of 140° C. for 20 minutes. The amount of the titanium disilicide film of the C49 structure etched off during the first etching by this mixed solution is extremely less than the amount of the titanium disilicide film of the C49 structure etched off during the first etching by the mixed solution of ammonia water and hydrogen peroxide (under this condition, about 1 nm of the film is etched off) (FIG. 5). During the first etching by the mixed solution of sulfuric acid and hydrogen peroxide, the titanium nitride film formed during the first rapid thermal annealing is removed in about 10 minutes. In this embodiment, therefore, the first wet etching is performed for 20 minutes including margin. Since the first wet etching is performed at 140° C., the maintenance of the composition of the mixed solution is required. During the first wet etching, the titanium-excess titanium silicide (Ti5 Si3) film is only little removed. In this embodiment, therefore, the second wet etching is performed using the mixed solution having a composition of NH4OH:H2O2 :H2O=1:1:5 at room temperature for 30 minutes.

출처 및 근거

DOI10.6084/m9.figshare.5104873.v1
특허 번호US05776822
출처 데이터셋uspto-grants-1998_07
ORD IDord-a3f0cbb786c64e44890566b6e9c43165
출처 메모uspto-grants-1998_07