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Huagongshe화공사 화학 정보 인쇄 보고서 · 연구 참고용
HRID 537661생성일: 2026년 10월 26일

Tetraethoxysilane → Tmos gaps

https://huagongshe.com/reaction/537661

반응식

참여 물질

역할이름HCID투입량
반응물TetraethoxysilaneHCID 6517—
반응물TetramethoxysilaneHCID 12682—
반응물(3-Aminopropyl)triethoxysilaneHCID 13521—
용매WaterHCID 962—
생성물Tmos gapsHCID 87361843—

반응 단계

Substrate film casting procedure—HEC and TEOS and GAPS HEC (1.25 g) was completely dissolved in deionized water (250 mL) and stirred vigorously for about 16 hours to provide a 0.5 wt % solution. Then 0.875 mL tetramethylorthosilicate (TMOS) and 0.125 mL γ-aminopropyltriethoxysilane (GAPS) were added to the 50 g of the HEC solution with stirring to provide a 1:3.5:0.5 (w:v:v) HEC/TMOS/GAPS solution. After approximately 10 minutes, the combined HEC/silica solution was added to a well plate as above. The solution was allowed to evaporate at room temperature 16 hours with lid on, followed by 75° C. for 8 hours, until dry. The plates were sterilized by UV irradiation (1 hr @ 366 nm).

출처 및 근거

DOI10.6084/m9.figshare.5104873.v1
특허 번호US08865465B2
출처 데이터셋uspto-grants-2014_10
ORD IDord-206b58d8b030492aa0cd56c7f56830cb
출처 메모uspto-grants-2014_10