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HuagongsheHuagongshe Chemistry Print Report · For research reference only
HRID 495870Generated: October 30, 2026

Sulfuric Acid → Sulfuric acid, hafnium(4+) salt (2:1)

https://huagongshe.com/reaction/495870

Reaction equation

Participants

RoleNameHCIDCharge
ReactantSulfuric AcidHCID 1118—
Reactant12055-23-1HCID 159422—
ProductSulfuric acid, hafnium(4+) salt (2:1)HCID 13094115—

Reaction Steps

After the unwanted hafnium oxide remaining in the bottoms of grooves 56a in the high dielectric film 52 on the wafer W reacts with the sulfuric acid to form hafnium sulfate, the wafer W is withdrawn from the hot concentrated sulfuric acid 62 in the treating tub 61. As shown in FIG. 7B, the wafer W is loaded into a cleaning tub 63 storing deionized water 64. The wafer W is immersed in the deionized water 64 in the cleaning tub 63. Though not shown, deionized water is continuously supplied to the cleaning tub 63 through an inlet port formed in a bottom thereof, and is overflowing an upper portion of the cleaning tub 63. By immersing the wafer W in the deionized water 64, the hafnium sulfate on the wafer W dissolves into the deionized water 64 to be removed from the wafer W.

Provenance & Evidence

DOI10.6084/m9.figshare.5104873.v1
Patent numberUS06941956B2
Source datasetuspto-grants-2005_09
ORD IDord-43cc0c4c36124459a817fceb1d482859
Source noteuspto-grants-2005_09